We now know that the three extant JFK autopsy skull X-rays in the National Archives collection are forgeries, altered to mask evidence of two frontal headshots.

The evidence for this proposition is thoroughly presented in a new book, The Assassination of President John F. Kennedy: The Final Analysis, which I have recently published with Dr. David W. Mantik, M.D., Ph.D. Armed with a Ph.D. in physics and a medical practice extending over five decades as a radiation oncologist, Dr. Mantik has seen the JFK autopsy skull X-rays more than anyone else. Using a densitometer, he measured the light coming through the X-rays millimeter-by-millimeter (with some measurements at a tenth-of-a-millimeter calibration).

Dr. Mantik has established indisputably that a white patch has been placed to cover the rear parietal and occipital bone on the right side of JFK’s as seen in the right lateral X-ray (Figure 1). This essay poses the question: Why was the white patch forgery necessary?

Figure 1. JFK Lateral X-ray Film: The White Patch at rear, Dark Space at front (circled in white).

Dr. Mantik explained how his optical density measurements proved scientifically that the white patch was a forgery:

The White Patch and the Black Space (Figure 1) were very different from my patients’ X-ray films. Therefore, I was eager to measure the Optical Densities (ODs) of these areas at the Archives. What I found there was quite astonishing. The White Patch transmits an impossibly greater percentage of light than the Dark Space.

He continued:

At the Archives, I measured many ODs of these two........

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